Specialized wavelength-dispersive XRF analyzer based on the Cochois scheme is designed for high-precision determination of chemical elements U, Th, Mo, Au, W, Tl, As, Pb as well as other elements in ores, rocks and when developing the technogenic fields.
Principle of analyzer operation is based on the excitation of the fluorescent radiation of sample atoms being under examination by radiation coming from an X-ray tube. Spectrum decomposition of the fluorescence radiation is performed according to Cochois method. The fluorescence radiation focused by analyzing crystal and standard line are marked on Rowland focal circle. Then, they are recorded by X-ray radiation detector in turn. The intensity of the fluorescent irradiation with a particular wavelength is directly proportional to the chemical element concentration in the material under examination.